Scanning Probe Microscope (SPM/AFM)
Model Name: Core AFM
Company Name: NANOSURF AG Switzerland
About:
Atomic Force Microscopy (AFM) is a powerful imaging technique used in nanotechnology and materials science. The Core AFM scans a tiny probe over a sample's surface, measuring the forces between the probe and the sample to observe high-resolution topography images.
Salient Features:
- Various operating modes: Contact mode, Tapping mode, Magnetic force · microscopy (MFM), Electrical force microscopy (EFM), Force modulation, Standard and Advanced lithography, and spectroscopy.
- Capable of topography image measurement of solid and biological samples.
- Mountain SPIP commercial license image analysis software for visualization and analysis of AFM images.
Applications:
- Surface topography, material properties at the nanoscale, biological samples, surface roughness, electrical property mapping.