Scanning Probe Microscope (SPM/AFM)
Model Name: Core AFM
Company Name: NANOSURF AG Switzerland
About:
Atomic Force Microscopy (AFM) is a powerful imaging technique used in nanotechnology and materials science. The Core AFM scans a tiny probe over a sample's surface, measuring the forces between the probe and the sample to observe high-resolution topography images.
Salient Features:
- XRD measurement with a 1.2KW X-ray tube source.
- Accurate XRD pattern measurement with ±0.01° precision.
- Various specimen holders for user-defined applications in pharmaceuticals, materials science, life science, and engineering.
- Vacuum chuck for tiny thin film samples and wafer testing.
- X-Ray Reflectometry (XRR):
- Measures the thickness, density, and roughness of thin films.
- Provides high-resolution data for thin film analysis
Applications:
- Material research, pharmaceuticals, energy sector, semiconductor industries, and crystallographic research.