Equipments
RF & DC Magnetron Sputtering with Thermal Evaporation System
Sputter deposition is a physical vapor deposition method that deposits thin films. Auto500 is a versatile front-loading coating system with a box chamber for R&D or pre-production use.
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Scanning Electron Microscope (SEM) with EDS
The Hitachi SU 3800 performs high-resolution characterization and analysis, yielding precise, genuine nanoscale scale information.
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X-Ray Diffractometer (XRD)
The X-ray diffractometer is an adaptable instrument that may be used to analyze powders, thin films, epitaxial layers, machined materials, ceramics, and other materials via X-ray diffraction.
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Scanning Probe Microscope
AFM stands for Atomic Force Microscopy. It's a powerful imaging technique used in nanotechnology and materials science. AFM works by scanning a tiny probe over a sample's surface and measuring the forces between the probe & sample to create high-resolution images.
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Pin on Disc Wear Testing Machine
Novus Tribo Solutions Pin-on-Disc Wear Testing Machine is a precise tool that replicates sliding wear conditions between two materials.
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LCR Meter
The ZM2376 LCR meter is a precision measurement tool designed to evaluate inductance (L), capacitance (C), resistance (R), and impedance (Z) across a wide frequency spectrum.
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CNC MICRO Machine tool
Hyper-15 is a tabletop type miniature micro machine tool with multi-process capability. This tool can perform processes such as Micro Turning (Vertical with a tool mounted on the Spindle), Micro Milling, Micro Drilling, Micro EDM Drilling, and Micro Scanning EDM (EDM Milling).
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Piezo-based Multicomponent Dynamometer
The Piezo-based Dynamometer represents a breakthrough in force measurement technology. Utilizing piezoelectric sensors, it converts mechanical stress into electrical signals with remarkable accuracy and sensitivity.
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Computerized Bottom Pouring Type Stir Casting Machine
Stir casting is a liquid metallurgy technique for fabricating composite materials, where a dispersed phase is mixed with a molten matrix metal by mechanical stirring.
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UV-VIS-NIR Spectroscopy with IRS
The V-770 Double Beam UV-Visible/NIR Spectrophotometer (JASCO) is a high-performance analytical instrument designed for precise and stable measurements across a wide spectral range from UV to near-infrared (≈190–2700 nm).
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Fourier Transform Infrared (FTIR) Spectroscopy
The JASCO FTIR-4X is a high-performance spectrometer featuring a 35,000:1 signal-to-noise ratio for precise molecular characterization of solids, liquids, and thin films.
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