X-Ray Diffractometer (XRD)
Model Name: D6 PHASER
Company Name: Bruker India Scientific Pvt. Ltd.
About:
The D6 PHASER X-ray diffractometer is an adaptable instrument designed for analyzing powders, thin films, epitaxial layers, ceramics, and other materials through X-ray diffraction. This technique involves directing main X-rays at the sample substance, where its wave nature causes diffraction at specific angles, providing information on the crystal structure.
Salient Features:
- XRD measurement with a 1.2KW X-ray tube source.
- Accurate XRD pattern measurement with ±0.01° precision.
- Various specimen holders for user-defined applications in pharmaceuticals, materials science, life science, and engineering.
- Vacuum chuck for tiny thin film samples and wafer testing.
- X-Ray Reflectometry (XRR):
- Measures the thickness, density, and roughness of thin films.
- Provides high-resolution data for thin film analysis
Applications:
- Material research, pharmaceuticals, energy sector, semiconductor industries, and crystallographic research.